MEMS and Nanotechnology
Officers
Chair: | Chenglin Wu | Missouri University of Science and Technology | |
Vice-Chair: | Rodrigo Bernal | University of Texas at Dallas | |
Secretary: | Maarten De Boer | CMU |
Video
Overview
We recently concluded the 17th International Symposium on MEMS and Nanotechnology. The MEMS and Nanotechnology symposium is aimed to provide a forum to foster the exchange of ideas and information among scientists and engineers who are involved in the research and analysis of the mechanics of materials, structures and devices relevant to fields of MEMS and Nanotechnology. The MEMS and Nanotechnology fields are specialized scientific areas that involve the miniaturization of conventional scale components and systems to take advantage of the inherent reduced size, weight, power and/or enhanced performance or novel functionality. The mechanics of structures and materials in these fields involves the application of principles ranging from the micron scale down to individual atoms and require the development of novel experimental tools and techniques. These principles often involve new physical and/or chemical phenomena governed by novel material laws and impart new properties to exploit. The investigation of the various factors controlling the material and structural response of components at these scales is critical in developing new applications as well as assessing their reliability and functionality under a wide range of mechanical, electrical and thermal loading conditions. Holding this symposium at the Annual Meeting of the Society for Experimental Mechanics provides a venue where state-of-the-art experimental methods can be leveraged in these endeavors.
The 18th International Symposium on Micro- and Nanomechanics (ISMAN) will include sessions titled: Emerging Microscopy Techniques, 1D & 2D Materials, Nanomechanics, Interfaces and Adhesion, MEMS Design, Energy Harvesting, and MEMS for Biomedical Applications.
2014 | Paper Title: Experimental Study and Numerical Analysis of Bistable Buckled Inclined Beams Author(s): Roger Bradshaw; J. Beharic; Cindy Harnett Presented at: 15th International Symposium on MEMS and Nano-technology, June 8-11, 2015, Costa Mesa, CA |
2013 | Paper Title: Warpage Measurement of Simulated Electronic Packaging Assembly Author(s): N. Du, G.F. Raiser, Medtronic, Inc.; W.C. Ralph, Southern Research Institute Presented at: 14th International Symposium on MEMS and Nano-technology, June 3-5, 2013, Lombard, IL |
2011 | Paper Title: Measuring Substrate-independent Young’s Modulus of Thin Films Author(s): J. Hay, Agilent Presented at: 12th International Symposium on MEMS and Nano-technology, June 13-16, 2011, Uncasville, CT |
2008 | Paper Title: Doppler Electron Velocimeter - Practical Considerations for a Useful Tool Author(s): P.L. Reu, Sandia National Laboratories Presented at: 9th International Symposium on MEMS and Nano-technology, June 2-5, 2008, Orlando, FL |
2006 | Paper Title: Micro-metric Topography Measurement by Imaging a Talbot Projected Fringe Pattern Author(s): R. Rodriquez-Vera, J.A. Rayas, A. Martinez, F. Mendoza-Santoya, Centro de Investigaciones en Optica Presented at: 7th International Symposium on MEMS and Nano-technology, June 3-6, 2006, St. Louis, MO |
2014 | Paper Title: Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array Author(s): Garth Blocher, Morteza Khaleghi, Ivo Dobrev, Cosme Furlong, Worcester Polytechnic Institute Presented at: 15th International Symposium on MEMS and Nano-technology, June 8-11, 2015, Costa Mesa, CA |
2013 | Paper Title: Molecular Interactions on InxGa1-xN Author(s): L.E. Bain, A.M. Hosalli, S.M. Bedair, T. Paskova, A. Ivanisevic, North Carolina State University Presented at: 14th International Symposium on MEMS and Nano-technology, June 3-5, 2013, Lombard, IL |
2012 (tie) | Paper Title: Etching Silicon Dioxide for CNT Field Emission Device Author(s): N.E. Glauvitz, R.A. Coutu Jr., P.J. Collins, L.A. Starman, Air Force Institute of Technology Presented at: SEM XII International Congress and Exposition, June 11-14, 2012, Costa Mesa, CA |
2012 (tie) | Paper Title: Simultaneous Measurement of Force and Conductance Across Single Molecule Junctions Author(s): S.V. Aradhya, M. Frei, Columbia University; M.S. Hybertsen, Brookhaven National Laboratories; L. Venkataraman, Columbia University Presented at: SEM XII International Congress and Exposition, June 11-14, 2012, Costa Mesa, CA |
2011 | Paper Title: Full-field Bulge Testing Using Global Digital Image Correlation Author(s): J. Neggers, J.P.M. Hoefnagels, Eindhoven University of Technology; F. Hild, S. Roux, LMT Cachan; M.G.D. Geers, Eindhoven University of Technology Presented at: 2011 SEM Annual Conference and Exposition, June 11-13, 2011, Uncasville, CT |