MEMS and Nanotechnology

 

Officers

Chair: Chenglin Wu | Missouri University of Science and Technology Email
Vice-Chair: Rodrigo Bernal | University of Texas at Dallas Email
Secretary: Maarten De Boer | CMU Email

Video

 


Overview

We recently concluded the 17th International Symposium on MEMS and Nanotechnology. The MEMS and Nanotechnology symposium is aimed to provide a forum to foster the exchange of ideas and information among scientists and engineers who are involved in the research and analysis of the mechanics of materials, structures and devices relevant to fields of MEMS and Nanotechnology. The MEMS and Nanotechnology fields are specialized scientific areas that involve the miniaturization of conventional scale components and systems to take advantage of the inherent reduced size, weight, power and/or enhanced performance or novel functionality. The mechanics of structures and materials in these fields involves the application of principles ranging from the micron scale down to individual atoms and require the development of novel experimental tools and techniques. These principles often involve new physical and/or chemical phenomena governed by novel material laws and impart new properties to exploit. The investigation of the various factors controlling the material and structural response of components at these scales is critical in developing new applications as well as assessing their reliability and functionality under a wide range of mechanical, electrical and thermal loading conditions. Holding this symposium at the Annual Meeting of the Society for Experimental Mechanics provides a venue where state-of-the-art experimental methods can be leveraged in these endeavors.

 

The 18th International Symposium on Micro- and Nanomechanics (ISMAN) will include sessions titled: Emerging Microscopy Techniques, 1D & 2D Materials, Nanomechanics, Interfaces and Adhesion, MEMS Design, Energy Harvesting, and MEMS for Biomedical Applications.

 
 
2014 Paper Title:  Experimental Study and Numerical Analysis of Bistable Buckled Inclined Beams
Author(s):  Roger Bradshaw; J. Beharic; Cindy Harnett
Presented at:  15th International Symposium on MEMS and Nano-technology, June 8-11, 2015, Costa Mesa, CA
 
2013 Paper Title:  Warpage Measurement of Simulated Electronic Packaging Assembly
Author(s):  N. Du, G.F. Raiser, Medtronic, Inc.; W.C. Ralph, Southern Research Institute
Presented at:  14th International Symposium on MEMS and Nano-technology, June 3-5, 2013, Lombard, IL
 
2011 Paper Title:  Measuring Substrate-independent Young’s Modulus of Thin Films
Author(s):  J. Hay, Agilent
Presented at:  12th International Symposium on MEMS and Nano-technology, June 13-16, 2011, Uncasville, CT
 
2008 Paper Title:  Doppler Electron Velocimeter - Practical Considerations for a Useful Tool
Author(s):  P.L. Reu, Sandia National Laboratories
Presented at:  9th International Symposium on MEMS and Nano-technology, June 2-5, 2008, Orlando, FL
 
2006 Paper Title:  Micro-metric Topography Measurement by Imaging a Talbot Projected Fringe Pattern
Author(s):  R. Rodriquez-Vera, J.A. Rayas, A. Martinez, F. Mendoza-Santoya, Centro de Investigaciones en Optica
Presented at:   7th International Symposium on MEMS and Nano-technology, June 3-6, 2006, St. Louis, MO
 

 

 
 
2014 Paper Title:  Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array
Author(s):  Garth Blocher, Morteza Khaleghi, Ivo Dobrev, Cosme Furlong, Worcester Polytechnic Institute
Presented at:  15th International Symposium on MEMS and Nano-technology, June 8-11, 2015, Costa Mesa, CA
 
2013 Paper Title:  Molecular Interactions on InxGa1-xN
Author(s):  L.E. Bain, A.M. Hosalli, S.M. Bedair, T. Paskova, A. Ivanisevic, North Carolina State University
Presented at:  14th International Symposium on MEMS and Nano-technology, June 3-5, 2013, Lombard, IL
 
2012 (tie) Paper Title:  Etching Silicon Dioxide for CNT Field Emission Device
Author(s):  N.E. Glauvitz, R.A. Coutu Jr., P.J. Collins, L.A. Starman, Air Force Institute of Technology
Presented at:  SEM XII International Congress and Exposition, June 11-14, 2012, Costa Mesa, CA
 
2012 (tie) Paper Title:  Simultaneous Measurement of Force and Conductance Across Single Molecule Junctions
Author(s):  S.V. Aradhya, M. Frei, Columbia University; M.S. Hybertsen, Brookhaven National Laboratories; L. Venkataraman, Columbia University
Presented at:  SEM XII International Congress and Exposition, June 11-14, 2012, Costa Mesa, CA
 
2011 Paper Title:  Full-field Bulge Testing Using Global Digital Image Correlation
Author(s):  J. Neggers, J.P.M. Hoefnagels, Eindhoven University of Technology; F. Hild, S. Roux, LMT Cachan; M.G.D. Geers, Eindhoven University of Technology
Presented at:   2011 SEM Annual Conference and Exposition, June 11-13, 2011, Uncasville, CT