Tomasz Garbowski

Tomasz Garbowski has a Diploma degree in Physics from the University of Düsseldorf. After working in the automotive industry, he joined ZEISS in Oberkochen, Germany in 2012. As Application Specialist for the ZEISS MultiSEM, the world’s fastest scanning electron microscope, he mastered the art of high-throughput imaging with this then new technology, collected millions of images over the time and supported and trained numerous colleagues and customers around the world on the system since then.
 

 

Is this your profile? Need to update it? Contact director@sem.org

Last Updated: 05/15/2024